VNXe Event logs Test

This test reports the statistical information about the events generated by the target storage system.

Target of the Test: An EMC VNXe Storage System

Agent deploying the test: A remote agent

Output of the test: One set of results for the target storage system being monitored.

Configurable parameters for the test
Parameters Description

Test Period

How often should the test be executed.


The host for which the test is to be configured.

Unisphere CLI Path

The eG agent uses the command-line utility, UEMCli.exe, which is part of the UniSphere Management Suite, to communicate with and monitor the storage device. To enable the eG agent to invoke the CLI, configure the full path to the CLI in the UniSphere CLI Path text box.

Username and Password

Provide the credentials of a user possessing monitor role to access the storage device in the Username and Password text boxes.

Confirm Password

Confirm the password by retyping it here.

VNXe Version

Select the version of the target EMC VNXe storage system that is to be monitored from this list. By default, 1600 will be chosen from this list.

Detailed Diagnosis

To make diagnosis more efficient and accurate, the eG Enterprise embeds an optional detailed diagnostic capability. With this capability, the eG agents can be configured to run detailed, more elaborate tests as and when specific problems are detected. To enable the detailed diagnosis capability of this test for a particular server, choose the On option. To disable the capability, click on the Off option.

The option to selectively enable/disable the detailed diagnosis capability will be available only if the following conditions are fulfilled:

  • The eG manager license should allow the detailed diagnosis capability
  • Both the normal and abnormal frequencies configured for the detailed diagnosis measures should not be 0.
Measures reported by the test
Measurement Description Measurement Unit Interpretation


Indicates the number of warnings generated during the test's last execution.


A high value of this measure indicates problems that may not have an immediate impact, but may cause future problems.

The detailed diagnosis of this measure describes all the warning events captured during the last measurement period.


This refers to the number of error events generated during the last execution of the test.


A very low value (zero) is desired for this measure, as it indicates good health.

An increasing trend or a high value indicates the existence of problems.

The detailed diagnosis of this measure describes all the error events captured during the last measurement period.


Indicates the number of critical events that were generated when the test was last executed.


A critical event is one that the storage system cannot automatically recover from.

A very low value (zero) indicates that the system is in a healthy state and is running smoothly without any potential problems.

An increasing trend or high value indicates the existence of fatal/irrepairable problems.

The detailed diagnosis of this measure describes all the critical events captured during the last measurement period.